A team of researchers at KAIST has developed a new AI technology that maintains high defect detection accuracy—even when manufacturing conditions change—without requiring costly retraining. The ...

A research team affiliated with UNIST has unveiled an innovative, high-precision AI-powered quality inspection system that reduces inspection time from 12 minutes to just under 3 seconds. This cutting ...

TrackEi™ to revolutionize track inspections in the Mobility segment with NVIDIA Jetson™ - Powered AI for Real-Time Defect Detection The latest development follows a series of accolades recognizing ...

Researchers built an AI system that adapts to process changes, maintaining defect detection accuracy and lowering retraining costs in smart factories. (Nanowerk News) Artificial intelligence is ...

TDK SensEI’s edgeRX Vision system, powered by advanced AI, accurately detects defects in components as small as 1.0×0.5 mm in real time. Operating at speeds up to 2000 parts per minute, it reduces ...

Lattice Semiconductor announced the latest release of the Lattice sensAI solution stack, delivering expanded model support, ...

Detecting sub-5nm defects creates huge challenges for chipmakers, challenges that have a direct impact on yield, reliability, and profitability. In addition to being smaller and harder to detect, ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

TrackEi™ to revolutionize track inspections in the Mobility segment with NVIDIA Jetson™ - Powered AI for Real-Time Defect Detection The NVIDIA Jetson™ platform delivers high performance AI compute and ...

SANTA CLARA, Calif. & BENGALURU, India--(BUSINESS WIRE)--L&T Technology Services Limited (BSE: 540115, NSE: LTTS), a global leader in engineering and technology services, today announced the launch of ...