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Mobile Quality Control Apps To Aid Early Assembly Line Defect Detection, Update

Alpha Software (781-229-4500) has introduced manufacturing quality solutions built on its Alpha TransForm no‑code platform to ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
Semiconductor Engineering

Techniques To Identify And Correct Asymmetric Wafer Map Defects Caused By Design And Process Errors

Asymmetries in wafer map defects are usually treated as random production hardware defects. For example, asymmetric wafer defects can be caused by particles inadvertently deposited on a wafer during ...
Seeking Alpha

Duos Technologies Delivers Near Real-Time Defect Identification Automation

JACKSONVILLE, Fla., July 27, 2023 (GLOBE NEWSWIRE) -- Duos Technologies Group, Inc. (DUOT) (“Duos” or the “Company”) (Nasdaq: DUOT), through its operating subsidiary Duos Technologies, Inc., a ...
AZOM

Identification of Loading Defects During EV Battery Electrode Production Using a New in-Line Mass Profilometry Technique

In this webinar, learn how to identify loading defects during the production of EV battery electrodes using a new in-line mass profilometry technique.
News Medical

Using convolutional neural network to automate the identification of chromatid cohesion defects

Scientists from Tokyo Metropolitan University have used machine learning to automate the identification of defects in sister chromatid cohesion. They trained a convolutional neural network (CNN) with ...