In today's industries, quality inspection in semiconductor manufacturing is critical. Many traditional fault detection and diagnosis techniques have been developed to determine the existence of trends ...

Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...

BEIJING, Aug. 31, 2023 /PRNewswire/ -- WiMi Hologram Cloud Inc. (NASDAQ: WIMI) ("WiMi" or the "Company"), a leading global Hologram Augmented Reality ("AR") Technology provider, today announced that ...

Researchers from Colombia’s Metropolitan Technological Institute of Medellin (ITM) have aggregated an open dataset of PV performance under different fault conditions. Available online, the set ...

Scientists in India have proposed using a multilayer neural network to find line-to-ground, line-to-line, and bypass diode faults in PV module strings. They tested the new approach on a 22.5 kW solar ...