Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

Driven by the expansion of wireless and power-efficient devices and by the marketing requirement to deliver 'green' electronic systems, designers are increasingly employing low power design techniques ...

Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...

Historically, testability is an afterthought in the design process. But heightening complexity of chip designs, and especially SoCs, forces testability (and manufacturability) to take a more central ...

Two companies have joined forces to optimize quality, integrity, post-programming validation, and cost for embedded test of reprogrammable logic cores. The increasing complexity of system-on-a-chip ...

Development teams that benefit most from high-resolution additive manufacturing are using it to ask better questions earlier ...

Palo Alto, Calif.—Test-and-measurement vendor Agilent Technologies, Inc. now offers a cost-effective mobile-phone functional tester. Agilent's GS-8210 system includes a mobile test station and test ...