(Nanowerk News) Turning up the intensity of x-ray beams used to probe the atomic structures of materials can actually reduce the intensity of x-rays scattered from the material, a RIKEN-led team has ...

Light fields, as a form of electromagnetic waves, are characterized by fundamental parameters including intensity, phase, and polarization. Precise imaging of these three parameters is crucial for ...

Fluorescence microscopy techniques are powerful tools for probing very small signals and revealing three-dimensional (3D) structural and functional properties of biological samples with high ...

Sieve analysis continues to be the traditional and most widely used technique for particle size determination. A sieve stack contains a number of sieves with increasing aperture size stacked upon each ...

Particle size analysis is crucial to quality control and product development in a number of key industries including aerosols, construction, food and beverage, paint and coatings, and pharmaceuticals.