Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
Wafer level testing is an important part of the supply chain of electronic components. For integrated circuits (ICs), these tests are firmly established – for photonic integrated circuits (PICs), the ...
STAr Technologies, a leading supplier of semiconductor test probe cards, unveils a new one-touch Aries-Prima Memory Test probe card. The probe card is designed specifically to meet the current high ...
Every wafer test touch-down requires a balance between a good electrical contact and preventing damage to the wafer and probe card. Done wrong, it can ruin a wafer and the customized probe card and ...
STAr Technologies, a leading supplier of semiconductor test systems and probe cards, announces the immediate availability of the Aries-Optima MEMS probe card, the world's first fine-pitch high-current ...
Simple mechanical changes can significantly improve probe card performance. Epoxy-ring probe cards with 2,000 or more probes are economical solutions to multi-DUT parallel test. The key to repeatable ...
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