Loaded board testing pays for itself by reducing field returns and bone-pile scrap. You seldom read an article about PCBs or semiconductors without encountering test-related phrases and acronyms. Cost ...

Fontana, CA. ECT announced it is leveraging its experience in probe and receptacle design and manufacture to provide cost-effective and reliable customer-focused solutions for challenging in-circuit ...

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...

The Iosipescu Shear and the V-Notched Rail Shear test methods are ASTM standards, ASTM D 5379 1 and D 7078 2, respectively. Both are used primarily for in-plane shear testing, but each can be used for ...

In-circuit test can exercise components individually. Boundary-scan test can evaluate components as well as interconnects. Functional test can test for faults that may have escaped other stages while ...

Test and programming fixtures are great time-savers for anyone who needs to deal with more than a handful of PCBs. Instead of plugging in connectors (or awkwardly holding probe tips or wires) to ...

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...