Agilent Technologies has introduced a 12-GHz differential wafer-probe tip that allows R&D and test engineers to use an oscilloscope to debug and test high-speed active ICs. The N2884A InfiniiMax ...

Those of us familiar with PCB work would agree that anything that helps hold probes secure and hands-free to components, traces, or test points is worth looking at. That’s where [2048bits]’ snap probe ...

Wafer inspection has become a critical part of the semiconductor manufacturing process. Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process ...

Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...

Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...

Remember fundamentals and practice situational awareness in taking measurements. It’s not only using the right probe, but it’s also using the probe right. Eliminating measurement artifacts is tricky, ...

This file type includes high resolution graphics and schematics when applicable. Selecting the right probe for your application is the first step toward making reliable oscilloscope measurements.